Unique Range of Analytical Tools for Electron Microscopes

Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT 2 software allows you to easily combine data obtained by these complementary methods for best results.

QUANTAX FlatQUAD - Where Conventional SDDs Reach Limitations

QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS. In combination with the ESPRIT analytical software suite, QUANTAX FlatQUAD provides unrivaled mapping performance, even for the most difficult samples.